Applications

• Amorphous & Polysilicon

  Measure thickness, crystallinity, and n and k of all forms of amorphous and polycrystalline silicon.
• CMP

  Our F80 Thickness Imaging products are used to measure oxide, STI, and metal CMP processes.
• Dielectrics

  CVD, dielectrics, barrier, PECVD, passivation, insulator, protection, Al2O3, CoO, ZnO, MoO, TiO2, Cr2O3, Nb2O5

  Filmetrics stocks instruments that measure the thousands of dielectric films used throughout industry.
• Hardcoat Thickness

  Acrylic, Automotive industry, Chemical resistance, Clear coating, Decorative coating, Hardcoat, Eyewear, Face shield, Hardcoat, Hardness, Interpenetration Layer, Marring, Ophthalmic lens, Optical quality, Plastic lens, Polycarbonate, Polyester, Siloxane, Primer, Protective film, Scratch resistant, Screen protection, Surface finish, Surface protection, Thermal cure, Top coating, Touch screen, UV coating, UV cure

  Filmetrics systems are used widely in the automotive industry to verify hardcoat and primer thickness.
• IC Failure Analysis

  Failure Analysis, FA, Silicon, Si, Integrated circuit, IC, Polishing, Backside failure analysis, Silicon thinning

  The F3-sX is used throughout the chip making industry to measure backside thinning of silicon.
• ITO & Other TCOs

  Indium tin oxide, ITO, tin-doped indium oxide, Transparent conductive oxide, TCO, Display, Front contact, Transparent Electrode, LED, LCD, Solar, Fluorine-doped tin oxide, FTO, TEC, TEC glass, Aluminum zinc oxide, AZO, Aluminum-doped zinc oxide, Zinc oxide, iZO, Indium zinc oxide, IZO, zinc-doped indium oxide

  Proprietary analysis algorithms allow one-click measurement of TCO thickness, index, and k.
• Medical Devices

  Stents, drug-coated stents, Drug-coating, Balloons, Angioplasty, Parylene, Microfluidic device, Air gap, Catheter, Membranes

  Measure thickness of angioplasty balloons, stent and implant coatings, and many others.
• Metal Thickness

  Metallized, Metallization, Foils, Stents, Mirrors, Steel, Stainless Steel, Gold, Nickel, Aluminium, Silver, Cobalt, Zinc, Molybdenum, Titanium, Chrome, Chromium, Niobium, Tungsten, Gallium, Germanium

  Measure thickness, index, and k of metal films up to 50nm thick.
• OLEDs

  PLED, AMOLED, Hole Transport (HT), Hole Injection Layer (HIL), Host Materials, anode, cathode, Alq3, NPB, phenylene vinylene, carbazole, thiophene, aniline, styrenesulfonate, phthalocyanine, naphthalene, fluorene, lithium, silver, ITO, calcium

  Measure thickness and index of NPB, AlQ3, PEDOT, P3HT, soluble Teflons, etc…
• Ophthalmic Coatings

  eyeglasses, HC, hardcoat, scratch resistant, AR, anti-reflection, reflectance, UV curable, hydrophillic, polycarbonate, high index, CR39, MR-6, MR-7, Trivex

  Use the F10-AR to measure reflectance and color, as well as AR and hardcoat layer thicknesses.
• Parylene Coatings

  Conformal

  Simply set your parylene-coated sample on the stage of the F3-CS to measure its thickness!
• Photoresist

  SU-8, resist, Photoresist, PR, AZ, AZP, ZEP, positive, negative, g-line, i-line, KrF, PMMA, FEP, GRX, KMPR

  We’ve measured dozens of different resists, and can generate index files for any resist you use.
• Porous Silicon

  Measure thickness, porosity, refractive index, and k of your porous silicon films.
• Process Films

  Filmetrics offers a full range of products for measuring semiconductor process films.
• Refractive Index & k

  n & k, complex, real , imaginary, refractive index, absorption, extinction coefficient, indices, Kramers-Kronig, optical dispersion, dielectric, Lorentz, Cauchy, photoresist, anomalous dispersion, path length

  Measure refractive index and extinction coefficient over wavelengths as wide as 190-1700nm.
• Silicon Wafers & Membranes

  We offer tabletop, mapping, and production systems for measuring silicon up to 2mm thick.
• Solar Applications

  Copper indium gallium diselenide, CIGS, Cadmium telluride, CdTe, Cad tel,, Amorphous silicon, Amorphous Si, a-Si, Cadmium sulfide, CdS, window layer, buffer layer, Thin-film photovoltaic, Thin-film PV, TFPV, photovoltaics, Solar, Solar cells, Inline, In-situ, Roll-to-roll, R2R, Evaporation, Sputtering, CVD, MOCVD, PECVD, Transparent conductive oxide, TCO, Indium tin oxide, ITO, tin-doped indium oxide

  Measure CdTe, CdS, CIGS, amorphous-Si, TCOs, anti-reflection (AR) layers, and more...
• Semiconductor Teaching Labs

  More than fifty Filmetrics F20s have been delivered for use in university teaching labs.
• Web Coatings

  Roll to roll, Roll measurements, Roll systems, Rolling substrate, Roll fed, Roll web, Reel to reel , R2R, Web coater, Autoweb, In-line, In-line monitor, Online thickness, Line monitoring system, Precision measuring tools, Automatic, Feeding, Production, Multipoint, High speed

  Filmetrics systems are widely used in the polymer-films community to measure thickness in-line.

Browse applications

• Amorphous & Polysilicon

  Measure thickness, crystallinity, and n and k of all forms of amorphous and polycrystalline silicon.

• CMP

  Our F80 Thickness Imaging products are used to measure oxide, STI, and metal CMP processes.

• Dielectrics

  Filmetrics stocks instruments that measure the thousands of dielectric films used throughout industry.

  CVD, dielectrics, barrier, PECVD, passivation, insulator, protection, Al2O3, CoO, ZnO, MoO, TiO2, Cr2O3, Nb2O5

• Hardcoat Thickness

  Filmetrics systems are used widely in the automotive industry to verify hardcoat and primer thickness.

  Acrylic, Automotive industry, Chemical resistance, Clear coating, Decorative coating, Hardcoat, Eyewear, Face shield, Hardcoat, Hardness, Interpenetration Layer, Marring, Ophthalmic lens, Optical quality, Plastic lens, Polycarbonate, Polyester, Siloxane, Primer, Protective film, Scratch resistant, Screen protection, Surface finish, Surface protection, Thermal cure, Top coating, Touch screen, UV coating, UV cure

• IC Failure Analysis

  The F3-sX is used throughout the chip making industry to measure backside thinning of silicon.

  Failure Analysis, FA, Silicon, Si, Integrated circuit, IC, Polishing, Backside failure analysis, Silicon thinning

• ITO & Other TCOs

  Proprietary analysis algorithms allow one-click measurement of TCO thickness, index, and k.

  Indium tin oxide, ITO, tin-doped indium oxide, Transparent conductive oxide, TCO, Display, Front contact, Transparent Electrode, LED, LCD, Solar, Fluorine-doped tin oxide, FTO, TEC, TEC glass, Aluminum zinc oxide, AZO, Aluminum-doped zinc oxide, Zinc oxide, iZO, Indium zinc oxide, IZO, zinc-doped indium oxide

• Medical Devices

  Measure thickness of angioplasty balloons, stent and implant coatings, and many others.

  Stents, drug-coated stents, Drug-coating, Balloons, Angioplasty, Parylene, Microfluidic device, Air gap, Catheter, Membranes

• Metal Thickness

  Measure thickness, index, and k of metal films up to 50nm thick.

  Metallized, Metallization, Foils, Stents, Mirrors, Steel, Stainless Steel, Gold, Nickel, Aluminium, Silver, Cobalt, Zinc, Molybdenum, Titanium, Chrome, Chromium, Niobium, Tungsten, Gallium, Germanium

• OLEDs

  Measure thickness and index of NPB, AlQ3, PEDOT, P3HT, soluble Teflons, etc…

  PLED, AMOLED, Hole Transport (HT), Hole Injection Layer (HIL), Host Materials, anode, cathode, Alq3, NPB, phenylene vinylene, carbazole, thiophene, aniline, styrenesulfonate, phthalocyanine, naphthalene, fluorene, lithium, silver, ITO, calcium

• Ophthalmic Coatings

  Use the F10-AR to measure reflectance and color, as well as AR and hardcoat layer thicknesses.

  eyeglasses, HC, hardcoat, scratch resistant, AR, anti-reflection, reflectance, UV curable, hydrophillic, polycarbonate, high index, CR39, MR-6, MR-7, Trivex

• Parylene Coatings

  Simply set your parylene-coated sample on the stage of the F3-CS to measure its thickness!

  Conformal

• Photoresist

  We’ve measured dozens of different resists, and can generate index files for any resist you use.

  SU-8, resist, Photoresist, PR, AZ, AZP, ZEP, positive, negative, g-line, i-line, KrF, PMMA, FEP, GRX, KMPR

• Porous Silicon

  Measure thickness, porosity, refractive index, and k of your porous silicon films.

• Process Films

  Filmetrics offers a full range of products for measuring semiconductor process films.

• Refractive Index & k

  Measure refractive index and extinction coefficient over wavelengths as wide as 190-1700nm.

  n & k, complex, real , imaginary, refractive index, absorption, extinction coefficient, indices, Kramers-Kronig, optical dispersion, dielectric, Lorentz, Cauchy, photoresist, anomalous dispersion, path length

• Silicon Wafers & Membranes

  We offer tabletop, mapping, and production systems for measuring silicon up to 2mm thick.

• Solar Applications

  Measure CdTe, CdS, CIGS, amorphous-Si, TCOs, anti-reflection (AR) layers, and more...

  Copper indium gallium diselenide, CIGS, Cadmium telluride, CdTe, Cad tel,, Amorphous silicon, Amorphous Si, a-Si, Cadmium sulfide, CdS, window layer, buffer layer, Thin-film photovoltaic, Thin-film PV, TFPV, photovoltaics, Solar, Solar cells, Inline, In-situ, Roll-to-roll, R2R, Evaporation, Sputtering, CVD, MOCVD, PECVD, Transparent conductive oxide, TCO, Indium tin oxide, ITO, tin-doped indium oxide

• Semiconductor Teaching Labs

  More than fifty Filmetrics F20s have been delivered for use in university teaching labs.

• Web Coatings

  Filmetrics systems are widely used in the polymer-films community to measure thickness in-line.

  Roll to roll, Roll measurements, Roll systems, Rolling substrate, Roll fed, Roll web, Reel to reel , R2R, Web coater, Autoweb, In-line, In-line monitor, Online thickness, Line monitoring system, Precision measuring tools, Automatic, Feeding, Production, Multipoint, High speed